Abstract:To improve the test efficiency of embedded security modules in comprehensive stress tests and reduce the procurement costs of host computers as well as labor costs, a novel general unattended test method for embedded security modules is proposed, and an unattended test system model is constructed. This model enables batch interface adaptation of embedded security modules, lossless signal relaying, and multi-dimensional stress monitoring of the test environment. The system is equipped with a function for the automatic and integrated generation of test procedures, which can automatically convert the input test parameters into a standard test task sequence with long cycles and multiple loops, thus realizing the fully unattended operation of the entire process including test process monitoring, batch product testing, and remote push of key test information. Experimental verification shows that the system can support the simultaneous testing of 20 products, with the test capability increased by 4 times, the procurement cost of host computers reduced by 100%, and the labor cost cut by 95%. It meets the requirements of conducting comprehensive stress tests for embedded security modules with high efficiency and low cost.