一种边界扫描链路测试算法设计

Design of a Boundary Scan Chain Test Algorithm

摘要:

针对边界扫描测试中可能存在的扫描链开路、被测器件设计不符合边界扫描测试标准、被测板电路设计不当影响边界扫描功能使用等问题,通过深入学习边界扫描基本原理并结合实际工程经验,提出了一种边界扫描链路测试算法。算法依据BSDL文件中的关键描述信息,控制边界扫描测试系统进行特征数据的移位,处理输出数据,实现对测试结果的判断,检验链路中存在的问题。该链路测试算法可通过编程实现,易于工程化,已经应用到实际边界扫描测试工作中,检验测试链路,提高边界扫描测试效率。

Abstract:

There can be various problems in boundary scan testing, such as open circuits in the scan chain, tested device designs not conforming to the boundary scan testing standards, and negative impact of the tested boards. Based on in-depth study of the basic principles of boundary scan and practical engineering experience, it proposed a boundary scan chain testing algorithm. According to the key description information in BSDL file, the algorithm controlled the boundary scan testing system to shift the characteristic data, processed the output data, realized the judgment of the test results, and checked the problems in the chain. The chain testing algorithm can be programmed and is easy to engineering. It has been applied to the actual boundary scan testing to check the chain and improve the testing efficiency.