导弹机内测试技术的国内外发展现状
DOI:
作者:
作者单位:

上海机电工程研究所

作者简介:

通讯作者:

中图分类号:

TN06;TM938

基金项目:


Development Status of Missile Built-in Test Technology at Home and Abroad
Author:
Affiliation:

Fund Project:

  • 摘要
  • |
  • 图/表
  • |
  • 访问统计
  • |
  • 参考文献
  • |
  • 相似文献
  • |
  • 引证文献
  • |
  • 资源附件
  • |
  • 文章评论
    摘要:

    导弹武器系统的综合测试是产品研发和使用中的重要保障技术,在武器系统的全寿命周期中扮演着越来越重要的角色;机内测试技术是提高系统测试性的关键方法之一,作为一种能够在设备或系统等测试单元内部自检的技术,机内测试在导弹测试领域中被广泛使用;介绍了国内外对机内测试的基本定义、特点、作用、虚警及抑制等发展的现状,并主要聚焦于导弹武器系统中的机内测试案例;针对机内测试在导弹领域应用中存在的问题,讨论了满足未来新一代导弹测试性需求的可能途径,并对机内测试技术未来的发展趋势进行了探讨和展望。

    Abstract:

    Comprehensive test of missile weapon system is an important guarantee technology in product development and use, and plays an increasingly important role in the life cycle of weapon system. Built-in Test(BIT) is one of the key methods to improve system testability, which is a kind of test technology for the internal self-test of equipment or system, so it is widely used in the field of missile test. This paper introduces the development status for the basic definition, characteristics, functions, the false alarm and its reducing strategies of BIT at home and abroad, and mainly focuses on the BIT cases in missile weapon systems. In view of the problems existing in the application of BIT in missile field, the possible ways to meet the testability requirements of new generation missiles in the future are discussed, and the development trend of in-flight testing technology in the future is discussed and prospected.

    参考文献
    相似文献
    引证文献
引用本文

吴伟,梁旗,林达,崔北鹏,丁伟.导弹机内测试技术的国内外发展现状计算机测量与控制[J].,2023,31(10):1-5.

复制
分享
文章指标
  • 点击次数:
  • 下载次数:
  • HTML阅读次数:
  • 引用次数:
历史
  • 收稿日期:2023-08-24
  • 最后修改日期:2023-08-24
  • 录用日期:2023-08-28
  • 在线发布日期: 2023-10-26
  • 出版日期: