基于FPGA的DDR SDRAM测试平台设计
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湖南艾科诺维科技有限公司

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Design of DDR SDRAM Test Platform based on FPGA
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    摘要:

    DDR SDRAM是FPGA板卡中的重要组成部分,其可靠性与带宽决定了设备能否正常工作;为了测试DDR SDRAM的性能是否符合预期,开发了一种基于FPGA的DDR SDRAM测试平台;平台包含一个基于DDR SDRAM控制器的测试器IP核,具有数据校验、带宽测量的功能;编写了控制测试器IP核的Tcl脚本,用于配置测试参数、控制测试流程与读取测试结果;在Python语言下使用PyQt5开发库设计了图形界面程序,能够根据用户操作生成并执行对应的Tcl脚本;最终实现了一个操作简单、测试流程可配置、自动输出测试结果的DDR SDRAM测试平台;测试结果表明,测试平台能够正确地进行DDR SDRAM测试并输出统计结果;对比MIG的示例工程,测试平台额外增加了带宽测试、结果统计、循环测试等功能,且使用的FPGA资源下降了30%,测试用时缩短了70%以上。

    Abstract:

    DDR SDRAM is an important component of FPGA boards, and its reliability and bandwidth determine whether the device can function properly. To verify that the performance of the DDR SDRAM meets expectations, a DDR SDRAM test platform based on FPGA is developed. The platform incorporates a tester IP core, which is based on a DDR SDRAM controller and has the capability to verify data and measure bandwidth. Tcl scripts are used to control the tester IP core, including setting test parameters, managing test processes, and retrieving test results. Additionally, a graphical interface program is designed using the PyQt5 development library in Python, which generates and executes corresponding Tcl scripts based on user input. As a result, a DDR SDRAM testing platform is implemented that is both user-friendly and flexible in terms of the testing process, while also providing automatic results output. Test results demonstrate that the platform accurately tests DDR SDRAM and outputs statistical results. Moreover, compared to the example design of MIG, the testing platform includes bandwidth testing, result statistics, and automatic control functions, ultimately reducing FPGA resource usage by 30% and cutting test time by more than 70%.

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引用本文

谢树平,毛源豪.基于FPGA的DDR SDRAM测试平台设计计算机测量与控制[J].,2023,31(10):67-75.

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  • 收稿日期:2023-03-06
  • 最后修改日期:2023-04-12
  • 录用日期:2023-04-13
  • 在线发布日期: 2023-10-26
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