基于典型集成电路的自动测试演示验证研究

Research on Automatic Test Demonstration and Verification Based on Domestic Very-large-scale Integration

摘要:

当前国产超大规模集成电路测试设备由于技术指标、工作可靠性、制造成本等诸多因素，在国内尚未得到大规模的市场应用；从集成电路的测试需求出发，给出了自研超大规模集成电路测试系统的总体架构组成，重点开展了基于典型集成电路的自动测试演示验证方法研究，并以国产某型超大规模静态存储器芯片作为演示验证的对象，利用自研测试系统完成了基于静态存储器芯片的自动测试演示验证试验；试验结果表明基于典型集成电路的自动测试演示验证方法和过程合理可行，能够为国产新研超大规模集成电路测试系统推广前的自动测试演示验证提供参考，同时可结合不同类型集成电路的测试需求深入应用到各类集成电路的测试过程。

Abstract:

At present, the homebred very-large-scale integration (VLSI) testing equipment has not been widely used in the domestic market due to many factors, such as technical specification, working reliability, manufacturing cost, etc. In this paper, the overall structure of the self-developed VLSI test system was given according to the test requirements of the integrated circuit. Meanwhile, this paper focused on the research of automatic test demonstration and verification method based on the typical IC. At last, a certain type of homemade very-large-scale static memory chip was taken as the test object of demonstration and verification, and the automatic verification test based on the static memory chip was completed by using the self-developed test system. The test results showed that the test method and process of automatic test demonstration and verification based on the typical IC was reasonable and feasible, and could provide a reference for the automatic test demonstration and verification before the popularization of the new homemade VLSI test system. Meanwhile the research content could be applied to the automatic test procedure of the other ICs deeply when combining the test requirements of different integrated circuits.