基于ATML的舰艇装备多状态测试系统设计

Design of Multi-state Test System for Naval Equipment Based on ATML

摘要:

目前设计的舰艇装备多状态测试系统存在的参数存在间断性，导致误差较大。为了解决上述问题，基于ATML设计了一种新的舰艇装备多状态测试系统。系统硬件由处理器、驱动器、传感器、监测器组成，选择麒麟990系列的处理器，能够有效降低内部负载，采用HDJ-8交流驱动器，内部引入2.7KV、5.7kw、10KV三个级别电压，保证系统的电源电量，传感器是HDU传感器，功能齐全，监测器选用骁龙芯片，在无线通信功能的基础上实现状态监测。系统软件设计过程中建立状态分量建模，通过分析文字文件、装备数据提取、状态检测实现舰艇装备多状态测试系统软件流程。实验结果表明，设计的基于ATML的舰艇装备多状态测试系统能够有效改善参数的间歇性，降低系统内部误差。

Abstract:

There are discontinuities in the parameters of the multi-state test system for naval equipment designed at present, which leads to large errors. In order to solve the above problems, a new multi-state test system for naval equipment was designed based on ATML. The system hardware is composed of processors, drivers, sensors, and monitors. Choosing Kirin 990 series processors can effectively reduce the internal load. HDJ-8 AC drivers are used. Three levels of voltages of 2.7KV, 5.7kw and 10KV are introduced to ensure the power supply of the system and the sensor is an HDU sensor with complete functions. The monitor uses a Snapdragon chip to realize status monitoring based on the wireless communication function. The state component modeling is established in the system software design process, and the software process of the multi-state test system for naval equipment is realized through the analysis of text files, equipment data extraction, and state detection. The experimental results show that the designed multi-state test system for naval equipment based on ATML can effectively improve the intermittency of parameters and reduce the internal errors of the system.