基于PXI某处理器模块ATE设备的设计与实现

Design and Realization of Processor Module ATEBased on PXI Platform

摘要:

随着测试技术的飞速发展,高性能、高信价比的PXI测试技术平台应运而生,将其应用于处理器模块综合自动测试设备(ATE)的软、硬系统结构设计,可为PXI测试平台应用于ATE设备提供应用实践平台,并为处理器模块ATE及类似设备提供优良的系统设计方案。其采用模块化、标准化思想,具有普遍的通用性及广泛的推广性。

Abstract:

With the rapid development of test technology, high performance and cost-effective PXI test platform came into being. Applying it to the soft and hard system structure design of a processor module integrated automatic test equipment (ATE), it will provide an practice chance for the application of PXI test platforms into ATE, and provide excellent system designs for processor module ATE equipment and other similar equipment. It adopts modularization, standardization design philosophy and has general universality and extensive promotion.