基于VIF特性分析的电路板故障诊断方法研究

Research on Circuit Board Fault Diagnosis Method Based on VIF Characterisic Analysis

摘要:

VIF特性曲线,即伏特-安培-频率特性曲线。分立元件或集成芯片是电路板故障的最小可隔离单元,元器件的损坏或特性改变是电路板故障的最根本原因。针对元件参数获取的问题,采用基于VIF特性分析的方法,对常见元器件进行了分析,并模拟了常见的故障模式,分析其VIF特性曲线特征,总结了各类组合元件曲线变化规律,针对某型灭火抑爆系统电路板的容性故障和感性故障进行了诊断,效果显著。

Abstract:

VIF characteristic curve, that is, volt-ampere-frequency characteristic curve. Discrete components or integrated chips are the smallest quarantinable unit for board failures, and component damage or characteristic changes are the most fundamental cause of board failure. According to the problem of component parameter acquisition, the method based on VIF characteristic analysis is used to analyze the common components, and the common fault modes are simulated. The characteristics of VIF characteristic curves are analyzed, and the curve of various combinations of components is summarized. The capacitive faults and inductive faults of the circuit board of the fire suppression and explosion suppression system were diagnosed and the effect was remarkable.