国产芯片自动测试系统射频测试模块设计

Design of Radio Frequency Test Module of Domestic Automatic Test Equipment System for Integrated Circuit

摘要:

针对当前射频芯片性能不断增强和应用日益广泛的现状，同时为了满足5G射频芯片测试需求，结合当前国际先进芯片自动测试技术，重点对国产芯片自动测试系统射频测试模块开展设计。通过对当前市场常用射频芯片以及5G射频芯片测试需求研究，通过采用小型化设计优化矢量信号收发模块的性能；为解决测试频率不断升高带来的问题，设计中采用模块化变频设计来拓展芯片测试频率范围；同时设计4个射频信号通道，每个通道具有4个射频端口，最大能够对16个被测件进行测试，显著提高芯片测试效率。该系统能够完成50M-12GHz矢量信号发射和分析，同时具有噪声系数测试，S参数测量，双音信号生成等功能。

Abstract:

In the view of current situation that the performance of radio frequency integrated circuit (RFIC) continues to enhance and the application of RFIC is increasingly widespread. At the same time, in order to meet the testing requirements of RFIC employed in 5G application, the design of radio frequency test module of domestic automatic test equipment (ATE) system for integrated circuits is developed on the basis of international advanced automatic testing technology of integrated chip. By investigating the market demand of testing requirements of common RFIC and RFIC employed in 5G applications, the performance of radio frequency (RF) transceiver module is optimized with technique of miniaturization design. Furthermore, the modularity design of frequency converter which solves the problem of increasing frequency of RFIC is utilized to increase the application range of the system. There are four RF channels, and each channel has four RF ports, so at most 16 device-under-test (DUT) can be measured by the system, and testing efficiency of system are improved markedly. In summary, the system can transmit and analyze 50M-12GHz vector signal along with functions of noise figure measurement, S-parameter measurement and generation of two-tone signal.