机内测试技术与虚警抑制策略研究综述

An Overview Review of Built-in Test Technologiesand False Alarm Reducing Strategies

摘要:

机内测试是指系统或设备内部提供的检测和隔离故障的自动测试能力,是一种能显著提高系统测试性和诊断能力的重要技术。机内测试具有检测效率高,测试成本低,可以对系统、模块、元器件分层进行检测的优异特性,在航空航天、电子设备、武器装备等领域具有广泛的应用前景。通过对机内测试在国内外的研究和发展现状进行分析和总结,介绍了机内测试技术的多种结构原理及其优缺点,对机内测试虚警抑制策略进行了全面综述,总结了机内测试系统的特性,讨论了其未来的发展趋势。

Abstract:

Built-in Test (BIT) is that the systems or equipment have the ability to detect and isolate faults automatically by themselves, and it is an important technology that can significantly improve the testability and diagnostic capability of the system. BIT has the advantages of high detection efficiency, low cost and that it can test the system, modules and components hierarchically, which makes it has wide application prospect in areas such as aerospace, electronic equipment, weaponry and so on. In this paper, the worldwide research and development of BIT were analyzed and summarized firstly, and then various structure principles, advantages and disadvantages were analyzed. Meanwhile, the false alarm reducing strategies of BIT were overviewed. Finally, the characteristics of BIT were summarized, and its future trends were also discussed.