基于CompactRIO的高速转塔式测试分选控制系统设计

Design of control system for high-speed test handler using turntable based on CompactRIO

摘要:

对高速转塔式测试分选控制系统进行设计。介绍了单颗芯片测试的整个工序流程，在此基础上采用CompactRIO为核心控制器，运用模块化设计方法建立了分选机系统控制框架，各模块与控制器之间的连接通过总线或者I/O口连接在一起。在软件架构上采用三层软件架构的设计方法对分选机控制系统进行设计，讨论了三层架构即表示层，逻辑层，操作层在转塔式测试分选机软件架构上的作用，且三层之间的联系是表示层联系逻辑层，逻辑层联系操作层，操作层与外界各个硬件的沟通,此外对芯片检测数据流存储进行了设计。这种控制系统设计能较大地提高转塔式测试分选机的工作效率和运行速度。

Abstract:

Abstract：Design of control system for high-speed test handler using turntable, Briefly introduced a chip test the entire process flow , On the basis of it, the test handler using turntable uses Compact RIO as the core controller and uses the modular design method to establish the system structure model, The connection between the module and the controller is connected via a bus or I/O port. On the software architecture the design method of three-layer software architecture is used to design the test handler using turntable. Discussing the effect of the three-layer architecture consists of the main level, the test level and the driver level in test handler using turntable .The main level calls the test level, the test level calls the driver level, the driver level is the communication with the outside world of the hardware .In addition, designing the chip detection data stream. The results show that the test handler using turntable has high real - time performance, high speed and high efficiency.