基于全局灵敏度的电路系统激励与测点优选

An Optimal Method of Selecting Test Point and Test Frequency Based on Global Sensitivity for System Fault Diagnosis

摘要:

针对模拟电路系统级故障诊断问题,提出一种基于全局灵敏度的测试点与测试频率优选方法;利用Pspice软件进行参数分析,避免了电路的拓扑分析和冗繁的计算过程,节省了时间开销,综合考虑元件参数变化影响,定义了网络全局灵敏度的概念,并以此为依据比较不同频率下测点的故障诊断能力,实现测点与测试频率的优选;通过实验仿真验证了方法的有效性,结果表明新方法提高了对系统的故障识别率。 

Abstract:

An optimal method of selecting test point and test frequency based on global sensitivity is proposed to overcome the problems of sub-network fault diagnosis for analog circuit. Parametric plotter is used with Pspice to avoid circuit topology analysis and tedious calculation process with time saving. Considering the parameters influencing element, the concept of global sensitivity of the network is defined, and as a basis to compare fault diagnosis capabilities of test points in different frequencies, optimal test point and test frequency is selected. Finally, an example is given to show efficiency of the method. Experimental results show that the new method improve the efficiency of diagnosis identify.