工业以太网芯片单粒子实验测试系统研制

Study of Industrial Ethernet Chip Test System in Single-event Experiment

摘要:

分析了单粒子效应对以太网芯片KSZ8851-16MLLJ的内部结构的影响,为全面了解以太网芯片在单粒子实验中的状态,研制出工业以太网单粒子实验测试系统；通过测试系统的实验得出相关参数,为以太网芯片在航天器上的应用提供技术参考；根据单粒子实验的现场情况,研制基于以太网的远程数据采集、控制系统,将测试数据实时地传输到远程观测终端；测试结果表明:单粒子实验测试系统可以对以太网芯片进行全面地监测,并有效地保护该芯片的安全性。

Abstract:

The single-event effect to the inner structure of Ethernet chip KSZ8851-16MLLJ is analyzed in the paper. The industrial Ethernet chip test system in single-event experiment is developed to fully understand the state of Ethernet chip. Some relevant parameters obtained from the test system experiment can provide technical reference for the application of Ethernet chip in spacecraft. According to the situation of single-event experiment, the remote data acquisition and control system based on the Ethernet is studied to transfer test data in real time to remote observation terminal. The experiment results show that the test system can monitor the Ethernet chip comprehensively and protect effectively its safety.