基于1149.7标准的测试生成方法研究

Study on Method of Test Generation Based on IEEE1149.7

摘要:

单芯片多核设计、片上系统等技术的不断发展为边界扫描技术带来了新的挑战,多扫描拓扑的测试矢量自动生成也成为了研究的重点与热点。基于1149.7标准对测试生成方法进行了研究,包括互连测试矢量、调试应用指令及数据和寄存器配置命令的生成,提出了测试生成的总体框架,以VS2008作为软件平台搭建自动测试生成系统,从数据库中提取目标板信息对寄存器进行配置,生成互连测试矢量或调试数据,最后将生成的信息插入数据库中,在互连测试矢量生成过程中,提出了一种基于边界扫描寄存器的功能来设置网络结点类型的新方法,有效地完成了对复杂网络的测试。

Abstract:

The continuous development of multicore-on-chip design and system-on-chip technology has brought new challenges to the boundary-scan technology, and the automatical test vector generation of multiple scan topoolgy test has become a research focus and hot spots. To explore the method of test generation based on IEEE1149.7, including interconnect test vector generation, debugging application instructions and data gerneration and register command generation, a general framework for test generation is presented. A automated test generation system is built using VS2008 as software platform, and the information of target board is extracted from database to configure register and generate interconnect test vector or debug data, which will be inserted into the database.