装备电子设备边界扫描系列标准及测试性设计技术研究

Research on IEEE Boundary-Scan Standard and testability design for electronic equipment

摘要:

随着新一代电子产品的复杂化和密集程度的不断提高,电路和系统的可测试性急剧下降,传统测试技术已经不能满足需要。针对我国军用电子设备的测试及诊断工作需求,通过对IEEE1149系列边界扫描测试标准进行了研究分析,分析各标准的特征范围、适用对象、各标准相互关系,可以分析梳理IEEE1149标准在我国军用电子设备测试性设计中的可行性和适用性,探索得到将边界扫描技术在测试性设计上的应用思路。将边界扫描技术应用于电子设备不同范围的测试设计,能有效地解决传统测试性设计的问题,能够提升诊断能力,缩减产品生产周期及研制费用。

Abstract:

With the increasing complexity of the new generation electron productions, the testability of circuits and systems decreases sharply. Traditional technology cannot meet the requirements of tests, so it has raised challenge in the failure diagnosis and maintenance of electronics-equipped device. Considered the need of testability of electronics, the IEEE1149 standards’ characteristics, elements, purpose and relationship is researched; and also the viability and applicability of IEEE1149 standards’ in electronic equipment testability design is analyzed, and the way to apply boundary-scan technology in testability design is discovered. The basis and reference to the national application of boundary-scan test technology in electronic equipment. Boundary-Scan test technology can solve the traditional testability design problem effectively, playing an important role in improving diagnosis ability, shortening product manufacture cycle and research cost.