光机部件通用测控平台研究与构建
DOI:
CSTR:
作者:
作者单位:

(1.中国空空导弹研究院,河南 洛阳 471000; ;2.北京航空航天大学,北京 100191)

作者简介:

杨 博(1983),男,陕西渭南人,研究生,工程师,主要从事光机部件设计工作。 付奎生(1971),男,河南洛阳人,研究员,主要从事光机部件设计工作。 刘亚斌(1963),男,北京人,教授,主要从事自动化科学与电气工程工作。

通讯作者:

中图分类号:

基金项目:


Development of Universal Testing Platform of Optic-mechanical Device
Author:
Affiliation:

(1.China Airborne Missile Academy, Luoyang 471009,China;;2.Beijing University of Aeronautics and Astronautics,Beijing 100191,China)

Fund Project:

  • 摘要
  • |
  • 图/表
  • |
  • 访问统计
  • |
  • 参考文献
  • |
  • 相似文献
  • |
  • 引证文献
  • |
  • 资源附件
  • |
  • 文章评论
    摘要:

    成像光机部件采用了许多全新的技术,研发测控系统以考核、测量与评估其各项性能指标也是重要课题,加之传统测控系统多是各型号自成一套,不能通用,在这种需求下,研发了具有系统化和通用化的测控平台;该测控平台按照通用化的设计思想,硬件部分设计了通用调理适配单元,对光机部件输出的信号进行统一调理适配,使信号具备标准的电气接口和物理接口,从而与通用集成板卡相连进行数据采集;软件部分设计了底层、逻辑层、表现层的层次结构,对于不同产品仅对表现层进行重新搭建而不需要修改底层和逻辑层;系统在实际应用中,图像和数据采集稳定,采样速率和精度高,实时性好,测控软件层次明确,数据吞吐量大,功能和性能满足多型光机部件的测控要求;该测控平台解决了成像光机部件的测试评估问题和测控系统的通用化问题,具有通用性和可扩展性强的特点。

    Abstract:

    The image-forming optic-mechanical device has used more new technology, the evaluation and test of which is also an important subject, and conventional test system is always adapted on itself and hasn’t general purpose. Under this background, the universal testing platform of optic-mechanical device is designed. According to universal design method, a signal processing unit is designed in hardware of the platform which transforms the output signals of optic-mechanical device into standard electrical and physical interface, and makes the signals can be acquired directly by universal integrated cards. Software of the platform is designed as hierarchical structure of base level, logical level and display level, and for different model of device only the display level need readjustment. The platform has already satisfied test demands of multi-mode optic-mechanical devices and provided good performance on stability of acquisition, real time character, sampling rate and precision, and the software of the platform has brevity structure and high handling data. The problem of test of image-forming optic-mechanical device and the universal requirement is solved by this method, which has good performance commonality and extensibility.

    参考文献
    相似文献
    引证文献
引用本文

杨博,付奎生,刘亚斌.光机部件通用测控平台研究与构建计算机测量与控制[J].,2015,23(8):2617-2621.

复制
分享
文章指标
  • 点击次数:
  • 下载次数:
  • HTML阅读次数:
  • 引用次数:
历史
  • 收稿日期:2014-12-11
  • 最后修改日期:2015-01-25
  • 录用日期:
  • 在线发布日期: 2015-10-08
  • 出版日期:
文章二维码