Abstract:Aiming at the test sequencing problem with multi-valued tests of electronic system, an optimal method for diagnosis strategy based on multi-valued test is presented. At first, on the basis of the dependency matrix, combined traditional binary test-based algorism with multi-valued test-based problem, a heuristic function suitable for multi-valued test is discussed. Then, with minimum test cost and steps for the optimal goal, AND/OR tree heuristic search algorithm is used for diagnosis generation, the diagnosis strategy based on multi-valued test is improved, and the specific implementation steps of optimal method for fault diagnosis strategy is offered. Finally, apply it to aviation equipment. The result shows that the algorithm is feasible, can generate optimal or inferior diagnosis tree.