基于边界扫描技术和TCL语言的簇测试设计

Design of Cluster Test Based on Boundary Scan Technology and TCL Language[JZ)]

摘要:

在边界扫描测试技术中,由BS器件和非BS器件主成的逻辑簇测试是研究的难点问题,文章介绍了高效、简明、移植性好的TCL语言,在深入研究边界扫描簇测试原理的基础上,以实现逻辑簇测试为目的,采用了TCL嵌入C++的方法实现测试用例的脚本化,完成了基于TCL语言的Cluster测试脚本设计；通过对数字电路实验板的测试结果分析,得到了使用TCL脚本语言与C++联合编程能够实现簇测试,并且可以提高边界扫描测试软件工作效率的结论,具有较好的应用前景。

Abstract:

In the boundary scan test technology, the BS device and non-BS device components into logic cluster test is the difficult problem in the study. This paper introduces TCL language which has high efficient and good portability, and take cluster test as an example, introduced the application of TCL language based on boundary scan technology.Through the test validation, the use of TCL script language with C++ programming can improve the work efficiency of boundary scan test software, has a good application prospect.