基于DSP和LabVIEW的1553B总线芯片测试系统的设计与实现

Design and Implementation of 1553B Bus Chip Test SystemBased on DSP and LabVIEW[HS)]

摘要:

B芯片测试系统由上位机和下位机两部分构成,下位机是用两片DSP芯片作为控制芯片构建两个1553B总线的终端,上位机在计算机上用LabVIEW平台控制一块1553B的总线板卡,并且通过串口发送各种测试命令给下位机,共同完成对DDC公司的BU-61580系列芯片的内部功能、总线协议功能及电气特性测试,对被测芯片处于BC、RT、MT三种不同类型终端时的各种功能与时序进行直观显示；测试环境与芯片在实际运用中效果一样,可以对芯片进行筛选,成本低；通过在某单位实际应用表明,该测试系统具有测试简单、功能全面、性能稳定的特点,系统还可自检,满足了用户的要求。

Abstract:

B bus chip test system is composed of upper and lower computer. The lower computer with two DSP chip as the control chip build two 1553B bus type terminals. The upper computer depend on controlling 1553B bus card with LabVIEW platform, and send various test commands through the serial port. common to complete the DDC's BU-61580 series chip's internal functions, bus protocol function and electrical characteristics test, display various function and timing of the chip test BC,RT, MT three different types terminals. Test environment is same as the chip results in practical use, the chip can be screened, low cost. By the actual application showed that the test system has tested a simple, full-featured, stable performance characteristics, the system can self-test, to meet the user's requirements.