基于二次线性插值的测试性分配方法研究

Research on Testability Allocation Based on Secondary Linear Interpolation Method

摘要:

为了实现对测试性指标的合理高效分配,考虑当前测试性发展的主流技术,以及分析测试性分配影响因素的基础上,提出了基于二次线性插值的测试性分配方法;运用测试性建模的理念,首先对系统进行横向划分和纵向划分,实现LRU与功能属性之间的映射关系,并对LRU进行聚类,根据聚类结果对指标进行第一次分配,即把指标分配给功能属性；然后,在功能属性的要求下,考虑各LRU的故障率、测试和故障扩散强度等特性参数,进行第二次插值分配;最后用实例进行了验证,结果表明:分配过程简单,结果可信无需修正,更符合实际要求;提出的方法打破了传统级级分配测试性指标的理念,采用两次分配即可实现系统级指标到LRU级指标的分配。

Abstract:

In order to achieve the rational allocation of testability index, the secondary linear interpolation method for testability allocation was proposed, considering the mainstream technology of the testability, and analyzing the main factors affecting the testability allocation. Using the testability modeling concept, firstly, the mapping relationship between the LRU and function attributes can be obtained by using the system partition transverse and longitudinal, and the LRU was clustered, the testability index was distributed for the first time according to the clustering results, namely the index was assigned to function attributes; And then, at the range of the function attributes, considering the characteristic parameters, such as the LRU failure rate, test, and fault diffusion intensity, on the second distribution of interpolation. Finally, the method has been verified with a practical example, the results show that the allocation process is simple and believable, results without correction, conforms to the actual requirements. the proposed method has break the traditional indicators, which can realized the testability allocation of the system level to the LRU level using secondary linear interpolation.